0346 GMT January 24, 2019
The atomic force microscope is a tool to study many properties on the nanometer and micrometer scale.
Possible properties that can be studied include topography, roughness, magnetic properties, elastic properties and adhesion.
The nanoscope is a high-resolution imaging tool that performs AFM techniques for surface characterization of properties, shapes and sizes.
A powerful software and compact hardware design enable the nanoscope AFM to easily acquire data from micro- to atomic-scale images.